Posters: Difference between revisions
From canSAS
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* [[media:Abstract_Yamaguchi.pdf | Microbeam-SAXS analysis on aqueous colloidal dispersions of nanosheets with extremely high aspect ratios]] <b> -- Daisuke Yamaguchi</b>  | * [[media:Abstract_Yamaguchi.pdf | Microbeam-SAXS analysis on aqueous colloidal dispersions of nanosheets with extremely high aspect ratios]] <b> -- Daisuke Yamaguchi</b>  | ||
* [[media:Abstract_YSHan.pdf | Small Angle Neutron Scattering Instruments at HANARO]] <b> -- Young Soo Han</b>  | * [[media:Abstract_YSHan.pdf | Small Angle Neutron Scattering Instruments at HANARO]] <b> -- Young Soo Han</b>  | ||
* [[media:Abstract_Heenan_Instrumentation.pdf | SANS instrumentation at ISIS TS-2 - successes and a few challenges]] <b> -- Richard Heenan</b>  | |||
* [[media:Abstract Barker.pdf | A New vSANS at NIST - challenges and opportunities]] <b> -- J. Barker</b>  | |||
Revision as of 22:02, 7 April 2015
POSTER ABSTRACTS
- Numerical evaluation, convolution and recombination of SANS instrument resolution using real-shape kernels: Application to TOF SANS -- Charles Dewhurst
 - The current status of SAXS beamlines at SPring-8 -- Takaaki Hikima
 - FOXTROT: A JAVA-Based Application to Reduce and Analyze SAXS and WAXS Piles of 2D Data at Synchrotron SOLEIL -- Javier Perez
 - Recent Activity of KUMASANS -- Yojiro Oba
 - Transmission Analysis in Time-of-Flight Small-Angle Neutron Scattering -- Yojiro Oba
 - 40m Small Angle Neutron Scattering Instrument at HANARO: Characteristics and Control -- Tae-Hwan Kim
 - Pushing the limits of SAXS home lab instrumentation -- Geert Vanhoyland
 - Electrophoretic mobility of double-stranded DNA in defectcontrolled polymer networks: correlation length and mesh size -- Xiang Li
 - Microbeam-SAXS analysis on aqueous colloidal dispersions of nanosheets with extremely high aspect ratios -- Daisuke Yamaguchi
 - Small Angle Neutron Scattering Instruments at HANARO -- Young Soo Han
 - SANS instrumentation at ISIS TS-2 - successes and a few challenges -- Richard Heenan
 - A New vSANS at NIST - challenges and opportunities -- J. Barker