/ToF-GISANS

Time-of-Flight GISANS (near surface scattering) involves all of the issues that have been raised under other topics but some are of particular importance:

• Instrument factors influence measurement strategies and tools are needed to aid this process.

• Background - effects of inelastic scattering can change background.

• Resolution is important both as regards wavelength and angle. The latter depends on collimation as well as footprint on the sample and spatial resolution of the detector. Full interpretation of data is likely to require extensive information to be available with processed data.

• Data reduction from raw data will require establishment of appropriate data formats for input to existing modelling and analysis software. The software may also need development to fully exploit the information that is available.

These highlights drawn from summary discussion should be edited and extended after more input from breakout group discussion.