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  • Peter Boesecke (ESRF, Grenoble) ...ons I propose to store, optionally, the variance of each pixel (see: Peter Boesecke, "Reduction of scattering data" J. Appl. Cryst. (2007). 40, s423–s427)
    4 KB (559 words) - 09:17, 19 July 2012

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  • Peter Boesecke (ESRF, Grenoble) ...ons I propose to store, optionally, the variance of each pixel (see: Peter Boesecke, "Reduction of scattering data" J. Appl. Cryst. (2007). 40, s423–s427)
    4 KB (559 words) - 09:17, 19 July 2012
  • see: [[2012_Data_Discussion]] and [[User:Boesecke | discussion from Peter Boesecke]]
    5 KB (695 words) - 13:27, 28 July 2012
  • * Peter Boesecke (ESRF)
    2 KB (360 words) - 07:23, 17 April 2015
  • * transformation to/from other coordinate descriptions (such as from Peter Boesecke) is needed ...either implicitly or explicitly described by the supplied metadata: [[User:Boesecke | SX_parametrization]].
    14 KB (2,211 words) - 14:52, 6 August 2012
  • * Peter Boesecke (ESRF Contact)
    6 KB (881 words) - 18:36, 21 February 2024
  • '''Absent:''' Peter Boesecke (ESRF), Ken Littrell (ORNL), Charles Dewhurst (ILL), Nick Terrill (Diamond)
    10 KB (1,630 words) - 06:33, 31 August 2009